Nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data in synthetic forsterite bicrystal samples (NERC Grant NE/S00162X/1)
The data are nanoindentation, high-angular resolution electron backscatter diffraction (HR-EBSD), and transmission electron microscopy data collected on samples of synthetic forsterite bicrystals at room temperature. The data were collected in two samples, with high- and low- angle grain boundaries (HAGB, 60°, [100]/(011) and SB, 13°, [100]/(016)). The EBSD data are the basis for the HR-EBSD calculation. The HR-EBSD results are presented as Matlab data files. The nanoindentation data are categorised as a function of sample (‘ol13’ – low-angle grain boundary; and ‘ol60’ – high-angle grain boundary), and indenter tip geometry (spherical (with a 10 or 5 micron radius) and pyramidal (Berkovich). The data are presented in .xls files. The TEM data are presented as .tif files. The TEM data were collected in specific indents with various distances from the interfaces. These data have been published in the manuscript: : The Role of Grain Boundaries in Low-Temperature Plasticity of Olivine Revealed by Nanoindentation, with the DOI: 10.1029/2023JB026763
nonGeographicDataset
https://webapps.bgs.ac.uk/services/ngdc/accessions/index.html#item182970
name: Data
function: download
http://data.bgs.ac.uk/id/dataHolding/13608147
eng
geoscientificInformation
publication
2008-06-01
Backscatter
X ray diffraction
Olivine
NGDC Deposited Data
revision
2022
NERC_DDC
2018-07-02
2021-10-01
creation
2023-11-03
notApplicable
: Nanoindentation tests were conducted on a Nano Indenter® G200, using continuous stiffness measurement on the loading segment of the experiment. We investigated the residual impressions of the nanoindents using high-angular resolution electron backscatter diffraction (HR-EBSD). For this purpose, we collected EBSD patterns using an Oxford Instruments NordlysNano EBSD detector and stored them for subsequent cross-correlation analysis. We prepared the TEM foils using a FEI Helios® Nanolab G3 Dualbeam system at the Utrecht University microscopy center. We imaged two liftouts using an FEI Talos® F200X with an acquisition acceleration voltage of 200 kV and a beam current of 5–10 nA, also at the Utrecht University microscopy center. We additionally imaged two liftouts using a JEOL® 2100F microscope at Imperial College London. The microscope was operated with an acquisition acceleration voltage of 200 kV, and an emission current of 120 μA.
publication
2011
false
See the referenced specification
publication
2010-12-08
false
See http://eur-lex.europa.eu/LexUriServ/LexUriServ.do?uri=OJ:L:2010:323:0011:0102:EN:PDF
.mat
The copyright of materials derived from the British Geological Survey's work is vested in the Natural Environment Research Council [NERC]. No part of this work may be reproduced or transmitted in any form or by any means, or stored in a retrieval system of any nature, without the prior permission of the copyright holder, via the BGS Intellectual Property Rights Manager. Use by customers of information provided by the BGS, is at the customer's own risk. In view of the disparate sources of information at BGS's disposal, including such material donated to BGS, that BGS accepts in good faith as being accurate, the Natural Environment Research Council (NERC) gives no warranty, expressed or implied, as to the quality or accuracy of the information supplied, or to the information's suitability for any use. NERC/BGS accepts no liability whatever in respect of loss, damage, injury or other occurence however caused.
University of Oxford
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University of Oxford
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British Geological Survey
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British Geological Survey
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British Geological Survey
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British Geological Survey
Environmental Science Centre,Keyworth
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2024-04-18